Thinfilm Metrology > AFM / STM
High resolution Multimode Atomic Force Microscopy / Scanning Tunelling Microscopy for Research & Teaching
Committed to Nanotechnology
In the new and fast growing market for nanotechnology and its applications, Nanosurf has committed itself to smart solutions in the area of scanning probe microscopes and positioning devices with nanometre resolution, as well as being a solution provider of new nanotechnological implementations in the future.
Miniaturization has been successful in most of the industrial parts and has led to lots of new, innovative solutions. The process of miniaturization has now reached the nanometre range and will therefore inspire new applications and continue to play an important role in industrial development.
New Teaching AFM- NAIO AFM/STM
Your All-in-One AFM for Nanoeducation & Small Samples
- Compact, Easy to use, Affordable
- All you need in a single device
Your All-in-One AFM for Nanoeducation & Small Samples
Key Features & Benefits
- Entire AFM system in a single device
- Integrated XY-positioning table, airflow shielding, and vibration isolation
- Top view camera and side view sample observation built in
- All standard operating modes available
- No laser adjustments required
- No system setup required: just plug into your PC and start the software!
Top view camera with zoom Side view observation Optional side view camera Easyscan 2 AFM Scan Head Specifications Maximum XY-range (resolution) (1) 70 μm (1.0 nm) Maximum Z-range (resolution) (1) 14 μm (0.2 nm) Static / Dynamic RMS Z-noise 0.6 nm (max. 0.8 nm) / 0.5 nm (max. 0.8 nm) Maximum sample size / height 12 mm / 3.5 mm Top view camera 3×3 mm FOV, 4× digital zoom, 2 μm optical resolution, 1600×1200 pixels, in-axis LED illumination Side view observation 5×5 mm FOV, variable LED illumination
(optional camera : 2×2 mm FOV, 1200×1024 pixels)
Approach 4 mm linear motor, continuous or step-by-step approach Imaging modes Static Force, Dynamic Force, Phase Contrast, MFM, EFM Advanced imaging modes (2) Spreading Resistance, Force Modulation Spectroscopy modes Force–Distance, Amplitude–Distance, Voltage–Distance Advanced spectroscopy modes (2) Current–Voltage, Stop by end value, Fwd & Bwd pause Lithography modes Static Force, Dynamic Force, Oxidation Advanced lithography modes (2) Draw and load CAD vector graphics, Bitmap images Remote control/add-ons (2) Windows scripting interface: compatible with LabView, C#, Visual Basic, MathLab, and other software... Operating system/PC requirements Windows XP/Vista/7 (32/64-bit), 1280x1024 px screen resolution, Core2 CPU, 4 GB RAM, 1 free USB 2.0 port Size (LWH), Weight / Power 204×204×160 mm / 6.5 kg / 100–240 VAC (30 W) (1) Manufacturing tolerances are ±10%
(2) NaioAFM Advanced Modes Option required
Compatible Options and Accessories
NaioAFM Side View Camera, NaioAFM Advanced Modes Option, Isostage Adapter, AFM Extended Sample Kit Particle size. Left: Staphylococcus aureus bacterial sample. Scan size 5.0 μm. Right: Gold colloids. Scan size 1.5 μm. Data storage. Digital video tape with magnetically stored data, as revealed by MFM. Scan size 50 μm. Atomic steps. HOPG. Scan size 3.2 μm. Z-range 3.5 nm.
Cantilever exchange. Quick and simple cantilever exchange with the NaioAFM's flip-over scan head design and cantilever exchange tools. Setup. A NaioAFM and a PC are all you need!
Your All-in-One STM for Nanoeducation
- Atomic resolution in minutes
- Extremely simple handling and reliable operation
- Controller and scan head integrated in a single device
An Easy Entry into the World of Atoms
The first scanning tunneling microscope (STM) was developed in 1981 by Binnig and Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making atoms directly visible to a small group of specialists. In 1997, Nanosurf went one step further and brought atoms to the classroom!
Today, well over a thousand Nanosurf STMs play a crucial role in nanotechnology education around the globe:
- Teachers appreciate the ease of use of Nanosurf STMs, allowing them to offer quick and hassle-free classroom demonstrations to their students.
- Students are motivated by the rapid successes achieved when using the STMs themselves during hands-on training.
- Anyone can safely handle a Nanosurf STM, since STM tips are simply cut from Pt/Ir wire without requiring etching in hazardous substances.
The NaioSTM is the successor to the well-known Easyscan 2 STM and brings together scan head and controller in a single instrument for even greater ease of installation, usability, and transportability. The whole setup is very resistant to vibrations and can be used in standard classroom situations.
Place your sample... Place the sample holder... Measure! NaioSTM Specifications Scan range, Z-range (1) 500 nm × 500 nm, 200 nm Current amplifier Max. 100 nA Imaging modes Const. current (topography), Const. Height (Current) Spectroscopy modes Current–Voltage, Current–Distance Lithography modes Patterning, Modification Sample approach Stick-slip motor Sample size Max. 10 mm diameter, Max. 3 mm thickness Data points Imaging: up to 2048×2048, Spectroscopy: up to 32768 Imaging speed Up to 10 Hz Computer requirements USB 2.0, Windows XP/Vista/7 (32- or 64-bit) Power supply 90–240 V AC, 50/60 Hz, 30 W Size (WDH), Weight 204 × 204 × 104 mm, 3.45 kg (1) Typical values
Compatible Options and Accessories
Advanced Spectroscopy & Lithography Option (incl. Scripting Interface), Isostage, STM Basic Sample Kit.
Atomic lattices. Left: Graphite (HOPG), scan size 2 nm. Right: MoS2, scan size 3 nm. Step heights. Left: Gold, scan size 500 nm. Right: YBCO, scan size 180 nm. Self-assembled monolayers. Left: Octane- 1-thiol, scan size: 6 nm. Right: Dotriacontane, scan size 13 nm. Quantum-mechanical effects. Charge density waves (large periodicity) can be seen superimposed on a TaS2 crystal lattice (small periodicity). Left: scan size 11 nm. Right: scan size 5 nm.
Setup. A NaioSTM and a PC are all you need!
Nanosurf® easyScan 2 - your modular system
Take a look at the easyScan 2 and discover a practically self-explanatory system that is simple enough to allow you to concentrate on your research without having to waste precious time setting up and reading the manual every time you want to use the system.
The modularity of the easyScan 2 series allow it to meet even apparently contradictory needs with a professional and affordable system tailored to your requirements. This makes the easyScan 2 an essential tool for teaching, training, and research in nanotechnology
Nano Flex AFM
The Nanosurf easyScan 2 FlexAFM
Nanosurf's renowned "ease of use" has been implemented consistently in the new FlexAFM scan head. The result is the most versatile and flexible AFM ever. Whether you want to operate the FlexAFM in air or in liquid environments, it makes no difference to you as a user. This is true flexibility!
Flexure-Based Scanner Technology
The performance of the new 2 FlexAFM scan head is also at a whole new level. The electro-magnetically actuated flexure-based scanner technology enables metrology-like applications, even in liquid. It is flat, linear, rugged, and fast!
SureAlign™ Laser Optics
The patented SureAlign™ laser optics eliminate laser adjustment once and for all, simply because the laser beam shift that normally occurs upon immersion into liquid is completely absent in the FlexAFM scan head. As a result, you are always working with an optimal laser signal.
Top and Side View
Our sample observation optics continuously provide a clear top and side view of the sample and cantilever, regardless of the measuring environment. The quality of our side view in liquid is unique, and is of great help during sample approach.
The Cantilever Holder
A specially designed cantilever holder allows wet samples to be measured in the same manner as dry samples. Changing between the two environments is also a breeze. The choice really is yours! Just place any dry or immersed wet sample under the scan head and start measuring.
System setup and operation have remained simple and straightforward. Hook up the scan head to the easyScan 2 controller, connect the USB cable to your computer, start the software, and you're ready to go — in minutes!
The FlexAFM sample stage provides an easy way to positionand approach samples of various thickness and type. Even samples in liquid containers, such as standard Petri dishes, fit on the sample stage and can be accessed by the FlexAFM without any hassle. At the same time, three leveling screws on the FlexAFM scan head maintain the scan head's capability to perform stand-alone measurements without sample stage.
The heart of the FlexAFM system, the "Liquid Ready" easyScan 2 controller, is as affordable and individually configurable as ever. All easyScan 2 modules and options (including previous easyScan 2 AFM and STM scan heads) are fully compatible, conferring even more versatility to your FlexAFM system.
Key Features & Benefits
- True measurement flexibility in air and in liquid
- Flat, linear, and fast scanning thanks to the flexure-based scanner technology
- More measurement versatility with the FlexAFM's liquid capabilities and added Lateral Force mode
- No more laser adjustment because of SureAlign™ optics
- Easy sample positioning and approach thanks to a clear top and side view in air and liquid
- Quick setup, easy handling, and immediate results because of Nanosurf's "ease of use" concept and design
With the Nanosurf Nanite, you can nano-measure hundreds of samples in one day, without having to be present during measurements, and without having to attend specialist nano-training. The Nanite's efficiency will make nano-surface analysis the industry standard.
The Nanosurf Nanite's initial draw is its increased efficiency. It allows batch programmable multiple measurements without SPM knowledge, significantly reducing labour cost and training time and delegating routine measurements to technicians. This alone will delight the head of your production department, but perhaps the even greater benefit is the improved morale of your workforce. Liberated of time-consuming repetitive tasks, they can employ their unique skills to maintain your advantage over your competition.
Lens Afm (AFM attachment to microscope)
A powerful add-on to optical microscopes or 3D profilometers
The Nanosurf LensAFM is an atomic force microscope that can be used in place of a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.
Main features and benefits of the LensAFM:
- Mountable on virtually any optical microscope or 3D optical profilometer
- Equipped with a quality objective lens for a clear view of your sample and the AFM cantilever
- Simple sample positioning using the optical microscope's view finder and position manipulators
- Integrated motor for automated cantilever approach. Just bring your sample into optical focus and let the LensAFM do the rest.
- Large AFM Z-range allows measurement of high structures
- All standard AFM modes available through the modular easyScan 2 controller
- Simply intuitive! Nanosurf's ease of use makes for a very short learning curve.
A powerful new tool that combines nanofluidics and AFM
Fluid Force Microscopy combines the unique possibilities of nanofluidics by Cytosurge with the positional accuracy and force sensitivity of the atomic force microscope to provide a whole new level of control and application possibilities in single-cell micromanipulation and beyond. An inverted microscope, the FlexAFM Inverted Microscope Option, a FlexAFM scan head with controller, and hollow cantilevers are prerequisites for performing Fluid Force Microscopy.
Fluid AFM attachment with complete set of accessories including, Cantilever kit, injector kit, reservoir kit and micro vacvuum arrangement
With special type of cantilever one can inject drug into the targeted site & then AFM image can be taken using the same cantilever
Pick & Place
By giving under pressure cell can be picked from the site & then by releasing the pressure at targeted site cells are placed there.
The cantilever can be used for spotting at regular intervals using the software.
Patch Clamp experiments can be done by creating little pressure using the Special type of cantilever then different enzymes can be added & then change in the resistance can be calculated.
With help of the special cantilever gentle injection into cells can be done,so damaging of cells is not done as force can be controlled.
AFM attachment to SEM
Super-flat AFM for SEM
Have you ever wanted to get fast 3D information in SEM? Kleindiek and Nanosurf have the plug-and-play retrofit solution for you.
The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens exciting new possibilities. SEM's are widely used for analytics in the micrometer and nanometer range and AFM techniques are useful for investigating the surfaces and characteristics of different materials down to nanometer detail.
Kleindiek Nanotechnik has developed a slim, compact and flexible scanner that allows AFM to be performed in SEM. Combined with Nanosurf's SPM controller and easy-to-use control software, information on lateral dimensions and material from SEM inspection can be readily complemented by precise topographical and force information in-situ.
The unique and effortless availability of these two sets of data brings new value-added functionality to existing tools and reduces experiment cycle time, thereby increasing research throughput.
The AFM system is compact and slim enough to fit inside any SEM and is even compatible with your load-lock if your SEM is fitted with one.
The system also works stand-alone in air.
- 3D information from simultaneous SEM and AFM pictures
- Notably compact (height 10 mm)
- Simple to operate
- Load-lock compatible
- Extremely stable operation
- Easy sample and tip exchange without laser adjustment
- Can be used in combination with micromanipulators and other
- in-situ and ex-vivo tools
- Works in air and in SEM
- The ultra-flat three-axis manipulator withunmatched stability and precision
- Operating range A 10 mm, B 80°, C 5 mm
- Piezo range A 1 μm, B 10 μm, C 1 μm
- Resolution A 0.25 nm, B 2.5 nm, C 0.25 nm
- Low drift 1 nm/min
- Reliable operation (one year endurance test)
- Fast pre-positioning by hand
- No backlash, creep or reversal play
- Fine and coarse displacement in one drive A = left/right, B = up/down, C = in/out
- Cantilever with integrated piezoresistive sensor
- Operates in contact mode with dynamic mode available in the near future
- Length 400 μm
- Width 50 μm
- Height 4 to 5 μm
- Tip radius < 20 nm
- Tip height > 5 μm
- Tip force constant 2–4 N/m
- Maximum tip force 80 μN
- Resistance 500 to 650 Ω
- Sensitivity 3.1 × 10–3 mV/nm @ Vbridge = 2.5 V
AFM scanning unit
- Ultra-flat scanner with scan ranges up to 15 μm in XY and 5 μm in Z
- SEM and FIB load-lock compatibility
- Quick and easy probe tip and sample exchange
- Total system height 9 mm
- Total system width 95 mm
- Maximum sample size 12 mm × 12 mm × 1 mm
- Weight 100 g
- User-friendly control and imaging software
- Built-in post-processing and analysis capabilities
- Integrated lithography and scripting functions
SPM S200 controller
- 16-bit data acquisition with up to 16 lines/s
- Up to 2048 × 2048 scan area data point
- Up to 65536 spectroscopy data points
- Hardware sample tilt compensation
- 16-bit scanner drive signals
- One-wire connection to scanner
- USB 2.0 connection to computer
- Modular design allows future upgrades that
- enable extended AFM measurement modes
- Power supply 90–240 V AC @ 50/60 Hz (100 W)
- Size 470 × 120 × 80 mm
- Weight 2.4 kg
Images taken from Nanosurf Instruments
AN00376 – Copolymer
Picture 1: 1x1µm image, z-range: 8nm
Picture 1: ePTFE membrane (100 µm × 100 µm)
Picture 1: Scan range 11µm x 11µm; Z range 10nm
AN00038 - Neutron Mirror
Picture 1: Scan range 2µm x 2µm; Z range 7nm
Picture 1: Low current cAFM measurement on HOPG. 500nm x 500nm; z-range 80pA
Picture 1: 560x560nm image; z-range 1nm-STM
Picture 1: KPFM Signal. Scan range:
10 µm 10 µm.
Picture 1: CaF2 (111): individual ions at step edges
Picture 2: Scan range 250 nm x 250 nm; Z-range 1.4 nm
AN00239 - Si(111)
atomic structure - Non-contact SFM using
qPlus quartz tuning fork sensor
Picture 1: Si(111)-(7x7)
AN00286 - NiFe - MFM Domain structures in connected Permalloy rings
Picture 1: scan range 10µm x 10µm; z-scale 1.1 Hz
AN00219 - Pentacene Film on TiO2
Picture 1: 7.7µm x 7.7µm scan range; 55nm z-range